Wednesday, April 28, 2010, 10:00 A.M. at the BMW Building, 555 W. 57th St
New York, NY
(Sixth floor, Room 613B)
Microscope Day at John Jay
Presented by New York Microscopical Society and John Jay College
Please join us for this event, which begins at 10 A.M. and concludes at 4 P.M. It is an informal event where speakers will give short presentations with ample time in-between to interact with other attendees and speakers.
This year’s speakers and their presentation titles (exact order of speakers is subject to change):
10:00 AM Opening Remarks: Peter Diaczuk, Past-President, New York Microscopical Society
10:15 Gerard Petillo and Peter Diaczuk– The Hammer is Back-A look at “hammer bounce” on ammunition primers
11:00 Rebecca Smith – Application of Statistical Analysis to Tool Marks in Bone
12:45 Dave Zweig- An Introduction to Digital Microscopy and its Application to Tool Marks
1:30 Helen Chan –Drill Bits: Do They Make Impressions?
2:15 Loretta Kuo - Statistical Analysis of Screwdriver Tool Marks
3:00 Alison Domzalski – Effects of Environmental Exposure on Human Scalp Hair Root Morphology
3:45 Closing remarks: Peter Diaczuk
Dave Zweig of Zarbeco will have a table displaying and demonstrating his newest digital microscopes (the MiScope) and attachments.
Bob Luce will have a table displaying and demonstrating the latest Leica microscopes.
Allison Forlenza from Nikon and Jenn Patane from Morrell Instruments will have a table displaying their new telepathology instrument, the Mi Grossing Station.
Refreshments will be served. This event is free and open to all those interested in microscopy
Photo ID necessary for entry into building.
When: Wednesday, April 28, 10:00 A.M.
Where: BMW Building, 555 W. 57th St New York, NY Sixth floor, Room 613B) scan0001.pdf
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